Group Description

D-65 is formed as a non-publishing subcommittee/work group specifically to identify, modify as needed, create as needed, and validate (by round-robin tests and other methods as appropriate) test and measurement methods specific to printed electronics, as a shared resource for other subcommittees operating under the D-60 committee. Once validated, test methods will be proposed and submitted for inclusion through the established process for TM-650.

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view all Recent Shared Documents (4)

Mon, Sep 26 2016
info | IPC-9204 Final Draft for Industry Review (1MB)
D-65 Printed Electronics Test Method Development and Validation
Tue, Sep 20 2016
info | D-65 Subcommittee -- Fall 2016 Meeting Agenda (21K)
D-65 Printed Electronics Test Method Development and Validation
Mon, Mar 7 2016
info | D-65 -- 2016 APEXPO Agenda (41K)
D-65 Printed Electronics Test Method Development and Validation
Thu, Oct 22 2015
info | D-65 Meeting Minutes October Web Meeting (14K)
D-65 Printed Electronics Test Method Development and Validation

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